Método para Identificar Correcciones de Defectos en Modelos de Características que representan Líneas de Productos / Method to identify corrections of defects on product line models

Luisa Rincón-Perez 1 Gloria-Lucia Giraldo-Gómez 2 Raúl Mazo 3 Camille Salinesi 3 Daniel Diaz 3
1 Department of Science and Engineering Computing
2 Universidad Nacional de Colombia (COLOMBIA)
3 CRI - Centre de Recherche en Informatique de Paris 1
Abstract : Software product line engineering is a promising paradigm for developing software intensive systems. Among their proven benefits are reduced time to market, better asset reuse and improved software quality. To be successful, software product line engineering represents the collection of products of the product line by means of product line models. Feature Models (FMs) are a common way to represent product lines by expressing the set of feature combinations that software products can have. However, these models might have defects. Defects in FMs might be inheriting to the products configured from these models. Consequently, defects must be early identified and corrected. In scientific literature, several works deal with identification of defects in FMs. However, only few of these proposals are able to explain how to fix found defects, and they only identify some corrections. This paper proposes a new method to detect all possible corrections that can be found when the method systematically eliminates features from the FMs. In particular, the proposed method was applied on 78 distinct FMs with sizes up to 120 dependencies. Preliminary evaluation indicates that the method proposed in this paper is accurate and potentially useful in real scenarios
Keywords : Software product lines Features Models Correc- tions Defects Software Engineering
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Conference papers
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Luisa Rincón-Perez, Gloria-Lucia Giraldo-Gómez, Raúl Mazo, Camille Salinesi, Daniel Diaz. Método para Identificar Correcciones de Defectos en Modelos de Características que representan Líneas de Productos / Method to identify corrections of defects on product line models. XL Latin American Computing Conference (CLEI), Sep 2014, Montevideo, Uruguay. ⟨hal-01071278⟩

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